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3 edition of Handbook of static secondary ion mass spectrometry found in the catalog.

Handbook of static secondary ion mass spectrometry

Briggs, D.

Handbook of static secondary ion mass spectrometry

  • 133 Want to read
  • 24 Currently reading

Published by J. Wiley in Chichester [West Sussex], New York .
Written in English

    Subjects:
  • Secondary ion mass spectrometry.

  • Edition Notes

    Includes bibliographical references and index.

    Other titlesStatic secondary ion mass spectrometry.
    StatementD. Briggs, A. Brown, and J.C. Vickerman.
    ContributionsBrown, A., Vickerman, J. C.
    Classifications
    LC ClassificationsQD96.S43 B75 1989
    The Physical Object
    Pagination156 p. :
    Number of Pages156
    ID Numbers
    Open LibraryOL2043636M
    ISBN 100471916277
    LC Control Number88020499

    @article{osti_, title = {A handbook of silicate rock analysis}, author = {Potts, P.J.}, abstractNote = {The topics covered in this handbook include the following: concepts in analytical chemistry; wet chemical and optical spectroscopy methods; X-ray and micro-beam methods; nuclear methods; pre-concentration techniques; and mass spectrometry.}, doi = {}, journal = {}, number =, volume. The surface of untreated wool has been investigated using x-ray photoelectron spec troscopy (XPS) and static secondary ion mass spectrometry (SSIMS). The wool surface is covered in a thin layer of Cited by:


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Handbook of static secondary ion mass spectrometry by Briggs, D. Download PDF EPUB FB2

A collection of Handbook of static secondary ion mass spectrometry book static SIMS spectra from over compounds. Each compound listed has spectra over a mass range for both positive and negative ions, with description Handbook of static secondary ion mass spectrometry book the spectra and information on how to extrapolate from this representative compound to others of its by: Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis shows SIMS analysts how to acquire improved data and gain a better understanding of that data.

This Handbook is unique—the information is not found elsewhere in book form, and, for the most part, Handbook of static secondary ion mass spectrometry book not published in the by: Handbook of static secondary ion mass spectrometry (SIMS), D.

Briggs, A. Brown and J. Vickerman (EDS), ISBN Price: £, US$Cited by: 1. Handbook of static secondary ion mass spectrometry.

experiment; experimental procedures used in acquisition of spectra. Part 2 Library of spectra. Part 3 Case studies: static SIMS in surface science; cleaning of semiconductor materials; SIMS imaging of the mechanism of oxide growth; the use of MS/MS techniques in materials analysis; SIMS.

Publication date Related Work Static secondary ion mass spectrometry. ISBN $ Handbook of static secondary ion mass spectrometry D.

Briggs, A. Brown and J.C. Vickerman John Wiley Et Sons, (£) In Secondary Ion Mass Spectrometry (SIMS) a material is bombarded with primary particles causing the emission of ions which are analysed using mass spectrometry.

There are two distinct types of SIMS. Title: Handbook of static secondary ion mass spectrometry (SIMS). By D. Briggs, A. Brown And J. Vickerman John Wiley,pp£ Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Handbook of static secondary ion mass spectrometry book on Analytical Chemistry and Its Applications) A.

Benninghoven, F. Rüdenauer, and H. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry.". “In summary, this handbook presents research from a variety of areas tied together by the common thread of mass spectrometry.

The authors present their works in a manner that is accessible to beginning researchers and include sufficient. The mass spectrometry community uses as the starting point of fast atom bombardment (FAB) when Barber and co-workers published their first paper.

The basis of FAB was laid down in the mids through pioneering research on static secondary ion mass spectrometry (SIMS) by Benninghoven. Handbook of static secondary ion mass spectrometry Secondary ion mass spectrometry (SIMS VII) A Bennmghoven, K T F Jansen, J Tompner and H W Werner (Eds 1, Secondary Zon Mass Spectrometry SIMS VlZZ, Wiley, Chichester, (ISBN O) xxv + pp Price 00 These Proceeduzgs of the Eighth Zntematumal Conference on Secondary Zon.

In book: Mass Spectrometry Handbook, Edition: online edition, Chapter: 41, Publisher: wiley, Editors: Mike S. Lee, pp– Static secondary ion mass spectrometry (S-SIMS) allows the.

The analytical use of mass spectra from static secondary ion mass spectrometry for the molecular identification of inorganic analytes in real life surface layers and microobjects requires an empirical insight in the signals to be expected from a given compound. A comprehensive database comprising over 50 salts has been assembled to complement prior data on by: The first 3 isotopes are stable isotopes and the last one is radiogenic.

There are two methods presently available for silicon isotope analyses such as gas source isotope ratio mass-spectrometry (IRMS) and Handbook of static secondary ion mass spectrometry book ion microprobe mass-spectrometry (SIMS).

The IRMS is a routine method and suitable for all kinds of samples. Secondary ion mass spectroscopy (SIMS) is an ion beam analysis technique useful for characterizing the top few micrometres of samples. Primary ions of energy –20 keV, commonly O−, Cs+, Xe+, Ar+, GaCited by: 6.

SECONDARY ION MASS SPECTROMETRY (SIMS) CONTENTS 1. Introduction 2. Primary Ion Sources Duoplasmatron Cs Ion Source 3. The Primary Column 4.

Secondary Ion Extraction 5. Secondary Ion Transfer 6. Ion Energy Analyser 7. Mass Analyser 8. Magnetic Field Control Hall Probe Detectors NMR Detectors 9. Secondary Ion Mass Spectrometry 2 MT where E is the energy of primary ion, dE/dx the energy loss per unit length perpendicular to the surface.

For 1 keV Ar + on copper, dE/dx= eV/Å and R = 10 Å. A common estimate is R = 10 Å / 1 keV. An important parameter related to the sputtering process is the atomic sputter yield Y, defined as.

A brief history of SurfaceSpectra. The precursor of the Static SIMS Library was the Handbook of Static Secondary Ion Mass Spectrometry produced by David Briggs, Alan Brown and John Vickerman and published by Wiley in This book provided standard quadrupole SSIMS spectra of.

Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers Author: Mike S.

Lee. Abstract. The physical bases of surface chemical analysis techniques are described in the context of semiconductor analysis. Particular emphasis is placed on the SIMS (secondary ion mass spectrometry) technique, as this is one of the more useful tools.

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of Related: Fast atom bombardment, Microprobe.

The following titles are a selection of books published by Wiley in Mass Spectrometry. To find out more about the following titles and to order, click the title. Secondary Ion Mass Spectrometry: SIMS XI G.

Gillen, ISBN: Handbook of Static Secondary Ion Mass Spectrometry D. Briggs, ISBN: Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) allows monolayer imaging and local analysis of monolayers with high sensitivity, a wide mass range, high mass resolution, and high.

Quantitative static secondary ion mass spectrometry of molecular ions from beta,4-dihydroxyphenylalanine (L-dopa) and indolic derivatives. Analytical Chemistry62 (8), Cited by:   Benninghoven, A., Chemical Analysis of INorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS),Angewandte Chemie International (in English), vol 33 #10, VanVaeck, L., Adriaens, A., and Gijbels, R.,Static Secondary Ion Mass Spectrometry: (S-SIMS) Part 1.

A timely addition to the highly acclaimed four-volume handbook set; volumes 5 and 6 highlight recent developments, particularly in the fields of new materials, molecular modeling and durability. Since the publication of the first four volumes of the Handbook of Fuel Cells inthe focus of fuel cell research and development has shifted from optimizing fuel cell performance with well.

Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or plastic with insignificant disturbance to its composition and structure.

It is one of the two principal modes of operation of SIMS, which is the mass. Static Secondary Ion Mass Spectrometry (SSIMS) Ion Scattering Spectroscopies (ISS and RBS) Scanning Tunneling methods (STM, STS, AFM) Other Surface Analytical Methods Summary and Comparison of Techniques Surface Analytical Equipment Suppliers The interaction between HCl and the surfaces of the films was studied using static secondary ion mass spectrometry (SIMS).

The temperature of the films ranged from 90 to a maximum of K, the temperature at which water begins to desorb by: The Handbook of Static SIMS with standard spectra was published in Books and reference materials. Handbook of Secondary Ion Mass Spectrometry, A. Brown, D.

Briggs and J.C. Vickerman, ppJohn Wiley & Sons, Imaging Secondary Ion Mass Spectrometry P. Van Espen, G. Janssens Introduction Types of Secondary Ion Mass Spectrometry Measurements Dynamic and Static Secondary Ion Mass Spetrometry Ion Microscope and Ion Microprobe Characteristics of Secondary Ion Mass Spectrometry This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials.

While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Buy and Download Individual Chapters.

In the decade following the first edition of this book, TOF-SIMS: materials analysis by Mass Spectrometry has been transformed by the adoption of heavy polyatomic or cluster primary ion sources. Lower damage rates and higher yields of analytically useful secondary ions have benefited all areas of application, especially in medical science, but the ability.

@article{osti_, title = {Handbook of x-ray spectrometry: Methods and techniques}, author = {Van Grieken, R.E. and Markowicz, A.A.}, abstractNote = {The purpose of this book is to review the state of the art of x-ray fluorescence analysis and to describe recent progress for wavelength- and energy-dispersive x-ray fluorescence, electron and heavy charged-particle-induced x-ray emission.

been head of the mass spectrometry laboratory at the Chemistry Department of Heidelberg University where I teach introductory courses and seminars on mass spectrometry. When students ask what books to read on mass spectrometry, there are various excellent monographs, but the ideal textbook still seemed to be missing – at least in my opinion.

Secondary ion mass spectrometry: | | Secondary ion mass spectrometry | | | ||| World Heritage Encyclopedia, the aggregation of the largest online encyclopedias. To determine the physical and chemical properties of polymer blends, surface analysis techniques such as x-ray photoelectron spectroscopy, static secondary ion.

Mass Spectrometry Handbook DOWNLOAD HERE. Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of.

i am a pvd engineer. the contennt of this book includes everything i want to know. if enginners can have this book, they do not need to spend much time searching tech.

information in front of pc. it is a handbook for sure. i can not wait to own one!. out of 5 stars PVD from A to Z, June 2, Principles and Applications of Mass Spectrometry This course note will develop Mass Spectrometry as an analytical tool in chemistry and biochemistry, at an advanced level.

Topics covered includes ionization, mass analyzers, ion dissociation, ion mobility, qualitative and. Pdf secondary ion mass spectrometry (SSIMS)– an emerging surface mass spectrometry. G. J. Leggett and J. C. Vickerman Abstract. The first page of this article is displayed as the abstract.

For reproduction of material from all other RSC journals and books. The surface of untreated wool has been investigated using x-ray photoelectron spec troscopy (XPS) and static secondary ion mass spectrometry (SSIMS). The wool surface is covered in a thin layer of lipid estimated to be approximately nm by: Mass spectrometry (MS) is an analytical technique that measures the mass-to-charge ratio of results are ebook presented as a mass spectrum, a plot of intensity as a function of the mass-to-charge spectrometry is used in many different fields and is applied to pure samples as well as complex mixtures.